Using SnapMapĪn extraordinarily useful tool in the arsenal of surface analyst is the SnapMap rapid image acquisition feature, which is common to both K-Alpha and Nexsa XPS instruments. In addition, mathematical processes such as TFA (target factor analysis), PCA (principal component analysis), and NLSF (non-linear least squares fitting) can be used to manipulate the image to extract important spectral information from the images. It is also possible to interrogate or average the spectra from individual pixel points for chemical information. Positional data can be extracted from the image to identify areas of interest or key features and defined as analysis points. The Avantage software, supplied with all Thermo Fisher Scientific XPS instruments, provides many options in the processing of SnapMap data. Contrary to scanning the X-ray beam, the stage raster method maintains the analysis area constant during the analysis, making sure that all areas of the image have the same definition. This process results in the production of a high resolution XPS image of the sample surface with each pixel point representing an individual snapshot XPS spectrum. The stage movement is synchronized with the high performance spectrometer which continuously gathers snapshot XPS spectra during rastering.
In order to realize this, the sample stage is shifted through the stationary X-ray beam so that the X-ray spot is effectively rastered across the chosen area of the sample surface. Thermo Scientific™ K-Alpha™ and Nexsa™ XPS systems are integrated with SnapMap technology that provides the surface analyst the ability to create high resolution, large area, XPS images within minutes. Sponsored by Thermo Fisher Scientific – X-Ray Photoelectron Spectroscopy (XPS) Apr 12 2018
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